Perturbation Theory for Thin Cladding Layers on Silicon Photonic Systems
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Date
2011-04
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Vanderbilt University. Dept. of Physics and Astronomy
Abstract
I develop a perturbation theory for resonant frequency shifts caused by thin
layer of material added to dielectric systems. This development can be used
to effectively model photonic surface-sensing systems, which use this
resonance shift to measure the presence of, e.g., biomolecules attached to
the sensor system. Direct modeling was previously intractable due to
extremely long simulation times required to account for the cladding
layers. The developed theory is verified against a special-case direct
simulation and by measuring the shift caused by silicon dioxide deposited on
a fabricated ring-resonator sensor.
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Keywords
photonics, ring resonator, perturbation theory, photonic crystal, sensing